The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8041319 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 18, 2011

Filed:

Dec. 23, 2004
Applicants:

Haixiang He, Woburn, MA (US);

Darwin A. Engwer, Pleasanton, CA (US);

Inventors:

Haixiang He, Woburn, MA (US);

Darwin A. Engwer, Pleasanton, CA (US);

Assignee:

Avaya Inc., Basking Ridge, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03D 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, a method involves determining whether a wireless connection between a first access point and a wireless station has failed. If so, a partial scanning process is conducted only on a subset of communication channels over which data is transmitted by access points neighboring the first access point. The subset of communication channels, inclusive of zero, is determined by analysis of a scanning history database.


Find Patent Forward Citations

He, Haixiang. (2011). Method and apparatus to intelligently perform scanning and assist scanning by profiling scanning history (U.S. Patent No. 8041319). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8041319

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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