The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Apr. 15, 2009
Applicants:
David R. Smith, Durham, NC (US);
David Schurig, Durham, NC (US);
Anthony F. Starr, San Diego, CA (US);
Jack J. Mock, Durham, NC (US);
Inventors:
David R. Smith, Durham, NC (US);
David Schurig, Durham, NC (US);
Anthony F. Starr, San Diego, CA (US);
Jack J. Mock, Durham, NC (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/23 (2006.01); G02F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
One exemplary metamaterial is formed from a plurality of individual unit cells, at least a portion of which have a different permeability than others. The plurality of individual unit cells are arranged to provide a metamaterial having a gradient index along at least one axis. Such metamaterials can be used to form lenses, for example.