The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

Mar. 19, 2008
Applicants:

Tsuyoshi Sonehara, Kokubunji, JP;

Takashi Anazawa, Koganei, JP;

Kenko Uchida, Tokyo, JP;

Tomoyuki Sakai, Kokubunji, JP;

Inventors:

Tsuyoshi Sonehara, Kokubunji, JP;

Takashi Anazawa, Koganei, JP;

Kenko Uchida, Tokyo, JP;

Tomoyuki Sakai, Kokubunji, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to provide a fluorescence detection apparatus having a high sensitivity, a high processing capacity and a competitive edge in cost, the fluorescence detection apparatus according to this invention irradiate the sample with light so that the aspect ratio of the form of the irradiated region by light on the arrangement surface of the sample may be 1±0.1. The preferable form of irradiate region is not limited to one and varies to some extent depending on the item to be optimized. The form of irradiated region may be, for example, a circle, an equilateral triangle, a square, a regular hexagon and the like.


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