The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Dec. 14, 2009
Gary W. Comstock, New Milford, CT (US);
Gerald F. Leitz, New Milford, NY (US);
Egbert E. Most, Southbury, CT (US);
Richard F. Stengl, Watertown, CT (US);
John E. Richter, Trumbull, CT (US);
Gary W. Comstock, New Milford, CT (US);
Gerald F. Leitz, New Milford, NY (US);
Egbert E. Most, Southbury, CT (US);
Richard F. Stengl, Watertown, CT (US);
John E. Richter, Trumbull, CT (US);
Pitney Bowes Inc., Stamford, CT (US);
Abstract
A method of measuring a thickness of a sheet being conveyed on a transport path includes rotating a substantially cylindrical reference surface disposed in the transport path and engaging a probe with the reference surface to determine a runout value for each of a set of positions along a circumference of the reference surface. The method further includes conveying the sheet on the transport path so that the sheet contacts the reference surface at one position of the set, engaging the probe with the sheet at the one position to determine a measured sheet thickness value, and adjusting the measured sheet thickness value based on the runout value for the one position to obtain an actual sheet thickness value.