The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Aug. 22, 2008
Masahiro Ota, Kyoto, JP;
Noriaki Oyabu, Osaka, JP;
Hiroaki Adachi, Osaka, JP;
Masayuki Abe, Osaka, JP;
Seizo Morita, Osaka, JP;
Yusuke Mori, Osaka, JP;
Takatomo Sasaki, Osaka, JP;
Masahiro Ota, Kyoto, JP;
Noriaki Oyabu, Osaka, JP;
Hiroaki Adachi, Osaka, JP;
Masayuki Abe, Osaka, JP;
Seizo Morita, Osaka, JP;
Yusuke Mori, Osaka, JP;
Takatomo Sasaki, Osaka, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A method for analyzing a sample in a liquid is provided, which is suitable for easily and reliably preventing a liquid for analysis from being evaporated. When the sample in the liquid is observed by using a scanning probe microscope (SPM), a sealing liquid () immiscible with a liquid for analysis () is filled around the liquid for analysis (), in which a sample () and a probe () are immersed, so as to form a sealing state, in which the liquid for analysis () is isolated from an external gas. The SPM enables the probe () disposed on a front end of a cantilever () to approach a surface of the sample () immersed in the liquid, scans the surface of the sample, and detects an interaction between the sample () and the probe (), thereby generating an image.