The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2011
Filed:
Jul. 21, 2008
Pierre Langlois, Quebec, CA;
Agostino Abatte, Boxborough, MA (US);
Josefina R. Quiles, Legal Representative, Boxborough, MA (US);
Pierre Langlois, Quebec, CA;
Agostino Abatte, Boxborough, MA (US);
Josefina R. Quiles, legal representative, Boxborough, MA (US);
Olympus NDT, Waltham, MA (US);
Abstract
The present invention relates to a flaw detector imaging apparatus for detecting and visualizing a flaw in a target material to be investigated, comprising an ultrasonic phase-array probe comprising an array of ultrasonic transducers and a flaw detector. The flaw detector includes at least one trigger channel to trigger ultrasonic emitting transducers of the array at respective time delays to produce an ultrasonic beam propagating through the target material, and a single receiver channel to receive echo signals produced by ultrasonic receiving transducers of the array in response to ultrasonic wave echoes reflected from a flaw in the target material. The single receiver channel comprises a delay circuit imparting to the received echo signals the respective time delays as used in the triggering of the ultrasonic emitting transducers and a combiner of the delayed echo signals. A processor is responsive to the echo signals produced by the ultrasonic receiving transducers, received by the single receiver channel and time delayed by the delay circuit to produce an image of the flaw from which the ultrasonic wave echoes are reflected. A display connected to the ultrasonic processor displays the image of the flaw.