The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Sep. 30, 2008
Bily Wang, Hsinchu, TW;
Kuei-pao Chen, Hsin Chu, TW;
Hsin-cheng Chen, Jhudong Township, Hsinchu County, TW;
Ming-hao Chou, Hsinchu, TW;
Bily Wang, Hsinchu, TW;
Kuei-Pao Chen, Hsin Chu, TW;
Hsin-Cheng Chen, Jhudong Township, Hsinchu County, TW;
Ming-Hao Chou, Hsinchu, TW;
Youngtek Electronics Corporation, Hsinchu, TW;
Abstract
A testing system for inspecting electronic devices includes a first transparent disk, a first image capturing unit disposed under the first transparent disk, a second disk disposed next to the first transparent disk, a guiding unit disposed on adjacent area between the transparent disk and the second disk, and a plurality of second image capturing units disposed around the second disk. A plurality of electronic devices is continuingly supplied onto the first transparent disk and the first image capturing unit is used for capturing the images of the bottom surfaces of the electronic devices. Then, the electronic devices are guided to the second disk via the guiding unit and the second image capturing units are used for capturing the images of other surfaces of the electronic devices. A testing method for electronic devices is further disclosed.