The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Aug. 12, 2008
Govindarajan T. Srinivasan, Portsmouth, NH (US);
Michael W. Hamblin, Stow, MA (US);
Joseph F. Wrinn, Winchester, MA (US);
Peter A. Reichert, Boston, MA (US);
Govindarajan T. Srinivasan, Portsmouth, NH (US);
Michael W. Hamblin, Stow, MA (US);
Joseph F. Wrinn, Winchester, MA (US);
Peter A. Reichert, Boston, MA (US);
Teradyne, Inc., North Reading, MA (US);
Abstract
According to one embodiment, a method for processing one or more X-ray images includes: receiving at least one image of the one or more X-ray images, the one or more X-ray images being of an assembly extending along a plane; based on the at least one image, autonomously determining a respective displacement value for each of portions of the assembly with respect to one or more directions of the plane, each of the displacement values being determined relative to a respective actual value; storing the displacement values; and applying a rule to the stored displacement values, the rule being for determining a defect status of the assembly.