The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2011
Filed:
Dec. 30, 2008
Applicants:
Timothy J. Maloney, Palo Alto, CA (US);
Bruce Chou, San Francisco, CA (US);
Inventors:
Timothy J. Maloney, Palo Alto, CA (US);
Bruce Chou, San Francisco, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01); G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
A charged device model (CDM) electrostatic discharge (ESD) testing is carried out at wafer level. Wafer CDM pulses are repeatedly applied and monitored. The wafer CDM (WCDM) pulses are accomplished with a probe-mounted printed-circuit board and a high-frequency transformer that captures fast CDM pulses. Modeling of CDM and WCDM in the time and frequency domain illustrates the dominant effects, and shows that WCDM can reproduce all the major phenomena of package-level CDM testing.