The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 2011

Filed:

Oct. 03, 2008
Applicants:

Peter Baechtold, Gattikon, CH;

Urs T. Duerig, Rueschlikon, CH;

Walter Haeberle, Waedenswil, CH;

Armin W. Knoll, Adliswil, CH;

Charalampos Pozidis, Thalwil, CH;

Deepak Ranjan Sahoo, Zurich, CH;

Gian R. Salis, Aeugst, CH;

Abu Sebastian, Adliswil, CH;

Inventors:

Peter Baechtold, Gattikon, CH;

Urs T. Duerig, Rueschlikon, CH;

Walter Haeberle, Waedenswil, CH;

Armin W. Knoll, Adliswil, CH;

Charalampos Pozidis, Thalwil, CH;

Deepak Ranjan Sahoo, Zurich, CH;

Gian R. Salis, Aeugst, CH;

Abu Sebastian, Adliswil, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A topography sensor and method include a probe configured to traverse a surface to determine a topography. A stray magnetic field is disposed in proximity to the probe. A magneto-resistive sensor is configured so that the stray magnetic field passing through it changes in accordance with positional changes of the probe as the probe tip traverses the surface.


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