The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Sep. 16, 2009
Kazuhiko Narushima, Kanagawa, JP;
Shigekazu Yamagishi, Kanagawa, JP;
Makoto Hashimoto, Kanagawa, JP;
Ken Ikeda, Kanagawa, JP;
Masafumi Ono, Kanagawa, JP;
Hinki Ryu, Kanagawa, JP;
Kenji Kuroishi, Kanagawa, JP;
Kazuhiko Narushima, Kanagawa, JP;
Shigekazu Yamagishi, Kanagawa, JP;
Makoto Hashimoto, Kanagawa, JP;
Ken Ikeda, Kanagawa, JP;
Masafumi Ono, Kanagawa, JP;
Hinki Ryu, Kanagawa, JP;
Kenji Kuroishi, Kanagawa, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
The invention provides an information processing apparatus including: a plurality of abnormality detection sections provided in each of a plurality of detection target portions, that detect an abnormality caused by high temperature at a predetermined first frequency; an indication detecting section that detects an indication that the abnormality will occur; and a controller that controls to set the detection frequency of the plurality of abnormality detection sections to a second frequency which is higher than the first frequency, when the number of times that the indication is detected within a predetermined period is more than a predetermined number of times.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile