The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 2011
Filed:
Jun. 10, 2010
Tatsuki Nakayama, Kure, JP;
Hideki Shindo, Kure, JP;
Tatsuki Nakayama, Kure, JP;
Hideki Shindo, Kure, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
A circularity measuring apparatus includes: a rotary table on which a measured object is loaded; a contact-type stylus configured to contact a substantially circular measured surface of the measured object with an inclination; a holder configured to hold the stylus within a predetermined stroke range so that an inclination angle of the stylus is changeable; a displacement detector configured to detect a displacement of the inclination angle of the stylus, which is caused due to a contact between the stylus and the measured surface; and a controller configured to: estimate a position of a top end of the stylus based on an output of the displacement detector; and instruct the holder in an optimal stroke range in the position.