The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2011
Filed:
Apr. 11, 2008
Applicants:
Marc-andre Dressler, Horn, DE;
Hans-guenter Limberg, Paderborn, DE;
Andre Rolfsmeier, Bad Lippspringe, DE;
Inventors:
Marc-Andre Dressler, Horn, DE;
Hans-Guenter Limberg, Paderborn, DE;
Andre Rolfsmeier, Bad Lippspringe, DE;
Assignee:
DSpace Digital Signal Processing and Control Enineering GmbH, Paderborn, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/00 (2006.01); G01C 22/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method for testing and calibrating a control unit including a microcontroller includes an influencing device and an adaptation unit. The adaptation unit includes a memory that can store at least part of a data of a data communication between the influencing device and the control unit. The memory can be read from and/or written to by the microcontroller of the control unit when the control unit is in an on state.