The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2011
Filed:
Mar. 27, 2007
James J. Allen, Jr., Red bank, NJ (US);
Janet Kenny, Wall, NJ (US);
John Yeager, Lawrenceville, NJ (US);
Muharrem Umit Uyar, Holmdel, NJ (US);
Linda Yeager, Lawrenceville, NJ (US);
James J. Allen, Jr., Red bank, NJ (US);
Janet Kenny, Wall, NJ (US);
John Yeager, Lawrenceville, NJ (US);
Muharrem Umit Uyar, Holmdel, NJ (US);
Linda Yeager, Lawrenceville, NJ (US);
Avaya Inc., Basking Ridge, NJ (US);
Abstract
A method for generating reliability tests for a telephone system is based upon sampling an orthogonal array which covers various combinations of test parameters. Field data is collected of actual telephone activity on a telephone system. The field data is evaluated so as to determine call-mix characteristics. Probabilistic weights for the different call-mix characteristics are obtained, and then the probabilistic weights are used to sample the test case scenarios generated in the orthogonal array which have the same call-mix characteristics. These test case scenarios are used to run tests on the telephone system. These tests are preferably performed using automated test scripts. After the test data is collected, reliability metrics are calculated from the test data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile