The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2011
Filed:
Jun. 12, 2009
Applicants:
Benoit Lepage, Quebec, CA;
Denis Faucher, Quebec, CA;
Inventors:
Benoit Lepage, Quebec, CA;
Denis Faucher, Quebec, CA;
Assignee:
Olympus NDT, Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01); G01N 27/82 (2006.01);
U.S. Cl.
CPC ...
Abstract
Disclosed is a method and an NDT/NDI probe deploying a slit or a flexible joint of probe bending region, preferably between two rows of probe elements to allow free bending between rows of probe elements and along the direction of the rows of elements and to allow two adjacent rows of elements to bend individually along its own natural bending lines perpendicular to the direction of the rows of elements. Also disclosed is the use of protective flexible pads to cover the probe elements and other probe components.