The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2011

Filed:

Aug. 30, 2007
Applicants:

Jason Haaheim, Chicago, IL (US);

Gregory Athas, Lisle, IL (US);

Inventors:

Jason Haaheim, Chicago, IL (US);

Gregory Athas, Lisle, IL (US);

Assignee:

Nanoink, Inc., Skokie, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 1/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of dipping a nanoscopic probe comprising dipping a nanoscopic tip at a dipping rate into an inkwell comprising ink, wherein the dipping rate is configured to be sufficiently faster than a rate of wicking. A nanoscopic probe comprising a nanoscopic tip and an inkwell configured to contain ink, wherein the nanoscopic probe is configured to dip into and retract from the ink at a rate that is sufficiently faster than wicking. Wicking can cause excessive amounts of ink to be deposited on nanoscopic tips, which can lead to contamination of inkwells and other nanoscopic tips.


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