The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2011
Filed:
Mar. 31, 2009
Yasuhiro Urabe, Gunma, JP;
Naoki Matsumoto, Saitama, JP;
Yuji Kuwana, Gunma, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a test apparatus that tests a device under test, comprising a driver circuit that generates an output signal according to a prescribed input pattern and supplies the output signal to the device under test; and a measuring section that judges acceptability of the device under test by measuring a response signal output by the device under test. The driver circuit includes an input terminal that receives the input pattern; a switching section that operates according to a logic value of the input pattern to generate the output signal; and an emphasized component generating section that is provided between the input terminal and the switching section, and that (i) generates an emphasized component according to a prescribed high frequency component of the input pattern and (ii) superimposes the emphasized component onto a voltage supplied to the switching section.