The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Jun. 26, 2007
Alan G. Gara, Mount Kisco, NY (US);
Dong Chen, Croton On Husdon, NY (US);
Paul W. Coteus, Yorktown Heights, NY (US);
William T. Flynn, Rochester, MN (US);
James A. Marcella, Rochester, MN (US);
Todd Takken, Brewster, NY (US);
Barry M. Trager, Yorktown Heights, NY (US);
Shmuel Winograd, Scarsdale, NY (US);
Alan G. Gara, Mount Kisco, NY (US);
Dong Chen, Croton On Husdon, NY (US);
Paul W. Coteus, Yorktown Heights, NY (US);
William T. Flynn, Rochester, MN (US);
James A. Marcella, Rochester, MN (US);
Todd Takken, Brewster, NY (US);
Barry M. Trager, Yorktown Heights, NY (US);
Shmuel Winograd, Scarsdale, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system are disclosed for detecting memory chip failure in a computer memory system. The method comprises the steps of accessing user data from a set of user data chips, and testing the user data for errors using data from a set of system data chips. This testing is done by generating a sequence of check symbols from the user data, grouping the user data into a sequence of data symbols, and computing a specified sequence of syndromes. If all the syndromes are zero, the user data has no errors. If one of the syndromes is non-zero, then a set of discriminator expressions are computed, and used to determine whether a single or double symbol error has occurred. In the preferred embodiment, less than two full system data chips are used for testing and correcting the user data.