The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2011
Filed:
Aug. 31, 2007
Fredrik Linaker, Antibes, FR;
Robert Bernard (Robin) Groenevelt, Antibes, FR;
Agata Opalach, Opio, FR;
Andrew Fano, Lincolnshire, IL (US);
Fredrik Linaker, Antibes, FR;
Robert Bernard (Robin) Groenevelt, Antibes, FR;
Agata Opalach, Opio, FR;
Andrew Fano, Lincolnshire, IL (US);
Accenture Global Services Limited, Dublin, IE;
Abstract
Image analysis techniques, including object recognition analysis, are applied to images obtained by one or more image capture devices deployed within inventory environments. The object recognition analysis provides object recognition data (that may include one or more recognized product instances) based on stored product (training) images. In turn, a variety of functionalities may be enabled based on the object recognition data. For example, a planogram may be extracted and compared to a target planogram, or at least one product display parameter for a product can be determined and used to assess presence of the product within the inventory environment, or to determine compliance of display of the product with a promotional objective. In yet another embodiment, comparisons may be made within a single image or between multiple images over time to detect potential conditions requiring response. In this manner, efficiency and effectiveness of many previously manually-implemented tasks may be improved.