The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Nov. 27, 2006
Applicants:
Richard C. Dokken, San Ramon, CA (US);
Gerald S. Chan, Saratoga, CA (US);
Phillip D. Burlison, Morgan Hill, CA (US);
Inventors:
Richard C. Dokken, San Ramon, CA (US);
Gerald S. Chan, Saratoga, CA (US);
Phillip D. Burlison, Morgan Hill, CA (US);
Assignee:
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for data logging from inside a semiconductor device, yielding timing performance information about the logic behind each and every flip-flop in the scan chain and displaying the sensitivity of certain flipflops to speed related manufacturing defects. The method comprises steps for testing, measuring, storing, and analyzing records for frequency characterization of complex digital semiconductors.