The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Feb. 27, 2007
Moon Young Jeon, Anyang-si, KR;
Min Young Kim, Seoul, KR;
Moon Young Jeon, Anyang-si, KR;
Min Young Kim, Seoul, KR;
Koh Young Technology Inc., Seoul, KR;
Abstract
An apparatus for measuring a 3-dimensional (3D) shape which can remove a shadow, which may occur when measuring the 3D shape, and also can measure a reflected light from an external surface of a test object, is provided. The apparatus for measuring a 3D shape includes a projection partgenerating a light, an image formation partsensing the light, a prism partbeing provided between the projection partand the viewing part, and a first mirror partand a second mirror partbeing provided in both ends of the prism part. Also, the prism partselectively transmits the light generated from the projection partto the first mirror partand the second mirror partto be directed towards an external surface of a test object. When the light reflected from the external surface of the test objectis selectively transmitted to the first mirror partand the second mirror partand thereby reflected, the prism parttransmits the reflected light to the viewing part