The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2011

Filed:

May. 15, 2007
Applicants:

Alexandre Dazzi, Les Ulis, FR;

Rui Prazeres, Bullion, FR;

Kevin Kjoller, Santa Barbara, CA (US);

Michael Reading, Norwich, GB;

Inventors:

Alexandre Dazzi, Les Ulis, FR;

Rui Prazeres, Bullion, FR;

Kevin Kjoller, Santa Barbara, CA (US);

Michael Reading, Norwich, GB;

Assignee:

Anasys Instruments, Inc., Santa Barbara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01N 21/84 (2006.01); G01Q 80/00 (2010.01);
U.S. Cl.
CPC ...
Abstract

An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.


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