The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2011

Filed:

Sep. 05, 2008
Applicants:

Ian D. Miller, Charlotte, NC (US);

Jorn W. Janneck, San Jose, CA (US);

David B. Parlour, Fox Chapel, PA (US);

Paul R. Schumacher, Berthoud, CO (US);

Inventors:

Ian D. Miller, Charlotte, NC (US);

Jorn W. Janneck, San Jose, CA (US);

David B. Parlour, Fox Chapel, PA (US);

Paul R. Schumacher, Berthoud, CO (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosure is made of approaches for mapping an electronic design specification to an implementation. In one approach, quality metrics are associated with functional units of the design, and the functional units are mapped to respective initial implementations. For each functional unit a respective quality indicator is determined based on the mapping. The quality indicator specifies a degree to which the functional unit achieves the associated quality metric. At least one of the functional units is selected for remapping based on the quality indicator of that functional unit or the quality indicator of another functional unit. An alternative implementation to the initial implementation is selected for each selected functional unit to improve the quality indicator. The selected functional unit is remapped to the selected alternative implementation.


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