The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Sep. 12, 2008
Eunha Kim, Menlo Park, CA (US);
Jeremy Wahl, Sunnyvale, CA (US);
Shenqing Fang, Fremont, CA (US);
Youseok Suh, Cupertino, CA (US);
Kuo-tung Chang, Saratoga, CA (US);
Yi MA, Santa Clara, CA (US);
Rinji Sugino, San Jose, CA (US);
Jean Yang, Glendale, CA (US);
Eunha Kim, Menlo Park, CA (US);
Jeremy Wahl, Sunnyvale, CA (US);
Shenqing Fang, Fremont, CA (US);
YouSeok Suh, Cupertino, CA (US);
Kuo-Tung Chang, Saratoga, CA (US);
Yi Ma, Santa Clara, CA (US);
Rinji Sugino, San Jose, CA (US);
Jean Yang, Glendale, CA (US);
Spansion LLC, Sunnyvale, CA (US);
Abstract
A semiconductor fabrication system and method are presented. A three dimensional multilayer integrated circuit fabrication method can include forming a first device layer and forming a second device layer on top of the first device layer with minimal detrimental heat transfer to the first layer by utilizing a controlled laser layer formation annealing process. A controlled laser crystallization process can be utilized and the controlled laser can include creating an amorphous layer; defining a crystallization area in the amorphous layer, where in the crystallization area is defined to promote single crystal growth (i.e. prevent multi-crystalline growth); and applying laser to the crystallization area, wherein the laser is applied in a manner that prevents undesired heat transfer to another layer.