The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Mar. 06, 2009
Eric Barr Kushnick, Santa Clara, CA (US);
Eric Barr Kushnick, Santa Clara, CA (US);
Advantest Corporation, Tokyo, Nerima-Ku, JP;
Abstract
Disclosed is a method and apparatus for calibrating a time vernier in an automatic test equipment (ATE) system, the method including generating a data signal and a reference signal whose periods differ by a small amount (dt), using precession of the data signal and reference signal to create accurate delay increments, and creating a trigger signal for Bit Error Rate Test (BERT) counting, the trigger signal having a select frequency such than an integer number (N) of triggers are generated with a precession period (TC). Upon occurrence of each trigger, a BERT is initiated for measuring data to determine strobe positions with respect to the data signal.