The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2011

Filed:

May. 18, 2007
Applicants:

Ronald A. Sartschev, Andover, MA (US);

Ernest P. Walker, Weston, MA (US);

LI Huang, Westlake Village, CA (US);

Inventors:

Ronald A. Sartschev, Andover, MA (US);

Ernest P. Walker, Weston, MA (US);

Li Huang, Westlake Village, CA (US);

Assignee:

Teradyne, Inc., North Reading, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2006.01); H04B 17/00 (2006.01); H04Q 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

Calibrating jitter in a communication channel between test equipment and a connection for a device under test (DUT) includes sampling test data in the communication channel at about a point of the connection to produce sampled data, where the test data travels through the communication channel at a first rate, and where the test data is sampled at a second rate that is less than the first rate, determining a first amount of jitter in the sampled data relative to the test data, and determining a second amount of jitter at about the point of connection based on the first amount of jitter.


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