The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2011

Filed:

Jul. 13, 2009
Applicants:

Masahiro Kuroda, Atsugi, JP;

Takashi Furuya, Atsugi, JP;

Kazuhiko Ishibe, Atsugi, JP;

Inventors:

Masahiro Kuroda, Atsugi, JP;

Takashi Furuya, Atsugi, JP;

Kazuhiko Ishibe, Atsugi, JP;

Assignee:

Anritsu Corporation, Atsugi-Shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A degree of conformity of error distribution of a digital signal to the Poisson distribution is quantitatively determined. The digital signal including error data, which is randomly generated at a predetermined error rate, is divided into data number of measurement units, wherein the data number is determined on the basis of the error rate. A sample number of the measurement units are acquired from the measurement units, and the number of errors contained in each measurement unit is measured as a measurement value. Further, the number of times of occurrence of each measurement value is calculated, a Poisson distribution function is calculated, and a degree of a bond between the Poisson distribution and the distribution of the number of times of occurrence is determined by using the chi-square goodness-of-fit test method.


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