The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2011

Filed:

Jun. 15, 2007
Applicants:

Kazuhiro Fujita, Tokyo, JP;

Masakatsu Suda, Tokyo, JP;

Takuya Hasumi, Tokyo, JP;

Inventors:

Kazuhiro Fujita, Tokyo, JP;

Masakatsu Suda, Tokyo, JP;

Takuya Hasumi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A delay circuit includes a first delay element, a second delay element, and an initializing section that measures a delay amount generated by the first delay element with respect to each delay setting value. The initializing section includes a first loop path that inputs an output signal of the first delay element into the first delay element and a second loop path that inputs an output signal of the second delay element into the second delay element. The initialization section includes a first measuring section that sequentially sets delay setting values mutually different from the delay setting value in the first delay element and sequentially measures delay amounts in the first delay element, a second measuring section that measures a delay amount in the second delay element, and a delay amount computing section that corrects a delay amount measured by the first measuring section.


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