The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2011
Filed:
Feb. 22, 2010
Applicants:
Jeo-young Shim, Yongin-si, KR;
Sung-ouk Jung, Suwon-si, KR;
Jin-na Namgoong, Yongin-si, KR;
Kyu-tae Yoo, Seoul, KR;
Jang-seok MA, Seongnam-si, KR;
Inventors:
Jeo-young Shim, Yongin-si, KR;
Sung-ouk Jung, Suwon-si, KR;
Jin-na Namgoong, Yongin-si, KR;
Kyu-tae Yoo, Seoul, KR;
Jang-seok Ma, Seongnam-si, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 5/00 (2006.01); B05D 1/36 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of manufacturing a calibration apparatus for an optical scanner. The method includes reacting a substrate coated with a functional group and a molecule capable of forming an activated excimer to immobilize the molecule on the substrate.
Shim, Jeo-young. (2011). Apparatus for calibrating optical scanner, method of manufacturing the same, and method of calibrating optical scanner using the same (U.S. Patent No. 7985453). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7985453
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile