The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Aug. 29, 2008
Yasuo Furukawa, Tokyo, JP;
Gorschwin Fey, Tokyo, JP;
Satoshi Komatsu, Tokyo, JP;
Masahiro Fujita, Tokyo, JP;
Yasuo Furukawa, Tokyo, JP;
Gorschwin Fey, Tokyo, JP;
Satoshi Komatsu, Tokyo, JP;
Masahiro Fujita, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
The University Of Tokyo, Tokyo, JP;
Abstract
Provided is a test apparatus that tests a device under test, including a vector expanding section that sequentially generates a plurality of test vectors; a vector selecting section that selects test vectors that cause a prescribed characteristic of the device under test, which is to be measured when test signals that are each based on one of the test vectors are supplied to the device under test, to fulfill a preset condition; and a judging section that judges pass/fail of the device under test based on measured values of the prescribed characteristic of the device under test supplied with the test signal based on the test vectors selected by the vector selecting section.