The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2011

Filed:

Mar. 03, 2010
Applicants:

Raghu Sreeramaneni, Boise, ID (US);

Vijay Vankayala, Allen, TX (US);

Greg Blodgett, Nampa, ID (US);

Inventors:

Raghu Sreeramaneni, Boise, ID (US);

Vijay Vankayala, Allen, TX (US);

Greg Blodgett, Nampa, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 17/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention include systems for calibrating an output circuit. A comparator is coupled to a calibration terminal and configured to determine whether the calibration terminal is in a first state coupled to a calibration resistor or in a second state. A calibration circuit is coupled to the calibration terminal and configured to generate a calibration value based in part on the presence or absence of the calibration resistor. An impedance selector is coupled to the calibration circuit, the comparator, and a default calibration value. The impedance selector is configured to select the default calibration value when the comparator indicates the calibration terminal is in the second state and to select the calibration value coupled from the calibration circuit when the comparator indicates the calibration terminal is in the first state.


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