The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Apr. 24, 2008
Masakatsu Suda, Tokyo, JP;
Masakatsu Suda, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a test apparatus for testing a device under test, the test apparatus including: a pattern generating section that inputs a test pattern to the device under test; a judging section that judges whether the device under test is defective or not, based on an output signal outputted from the device under test; a power supply apparatus that supplies a source power to the device under test; and a setting section that detects a fluctuation amount of the source voltage resulting when the test pattern is inputted to the device under test, and sets, based on the detected fluctuation amount, a current range within which a compensation current that is in accordance with a fluctuation of a consumption current consumed by the device under test is generated at a predetermined number of levels so as to compensate a fluctuation of a source voltage to be applied to the device under test attributable to the fluctuation of the consumption current.