The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7973543 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 05, 2011

Filed:

Jul. 11, 2008
Applicants:

Hiroki Andoh, Tokyo, JP;

Kunihiro Matsuura, Tokyo, JP;

Satoshi Kodera, Tokyo, JP;

Inventors:

Hiroki Andoh, Tokyo, JP;

Kunihiro Matsuura, Tokyo, JP;

Satoshi Kodera, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a measurement apparatus that measures a current flowing through a load, including a power supply section that outputs a current supplied to the load; a current measuring section that measures a load current flowing between the load and the power supply section; a switch that is connected in parallel with the current measuring section between the load and the power supply section; and a control section that disconnects the switch during measurement of the load current and connects the switch when the load current falls outside of a predetermined reference range.


Find Patent Forward Citations

Andoh, Hiroki. (2011). Measurement apparatus, test apparatus and measurement method (U.S. Patent No. 7973543). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7973543

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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