The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2011

Filed:

Aug. 18, 2009
Applicants:

Wei-jen Chen, Kaohsiung County, TW;

Ho-yin Chen, Hsinchu County, TW;

Lien-sheng Yang, Hsinchu, TW;

Shu-jen Wu, Kinmen County, TW;

Inventors:

Wei-Jen Chen, Kaohsiung County, TW;

Ho-Yin Chen, Hsinchu County, TW;

Lien-Sheng Yang, Hsinchu, TW;

Shu-Jen Wu, Kinmen County, TW;

Assignee:

Etron Technology, Inc., Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method for detecting word line defect includes activating a first word line for reading a first data pre-stored in the memory cell, suspending the first word line for a predetermined period and then writing a second data complementary to the first data into the memory cell, activating again the first word line for reading a third data from the memory cell, and comparing the second and the third data for determining if an electrical coupling path exists between the first word line and a second word line.


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