The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Dec. 27, 2007
Applicants:
Hui-shen Shih, Changhua Hsien, TW;
Yu-fang Chien, Taipei County, TW;
Inventors:
Hui-Shen Shih, Changhua Hsien, TW;
Yu-Fang Chien, Taipei County, TW;
Assignee:
United Microelectronics Corp., Hsinchu, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); G01B 5/02 (2006.01); G01B 3/22 (2006.01); G01B 5/20 (2006.01); G01D 1/00 (2006.01); G06F 15/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of controlling statuses of a plurality of wafers is described. A status of a wafer among the wafers is determined. An action related to the status is taken, according to the status determined, to the wafer and/or other wafers to improve a yield or yields thereof.