The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Mar. 31, 2005
LI Huang, Westlake Village, CA (US);
Timothy Derksen, Tucker, GA (US);
Xiaoxi Zhang, Tarzana, CA (US);
Charles Evans Crapuchettes, Santa Clara, CA (US);
Stephen Hauptman, Camarillo, CA (US);
Li Huang, Westlake Village, CA (US);
Timothy Derksen, Tucker, GA (US);
Xiaoxi Zhang, Tarzana, CA (US);
Charles Evans Crapuchettes, Santa Clara, CA (US);
Stephen Hauptman, Camarillo, CA (US);
Teradyne, Inc., North Reading, MA (US);
Abstract
Calibrating automatic test equipment (ATE) includes determining an offset between a reference timing event and a channel event, where the channel event is associated with a communication channel of the ATE, and adjusting signal transmission over the communication channel based on the offset. Determining the offset may include obtaining a first time at which a reference timing signal is received at a device associated with a reference timing source, obtaining a second time at which the reference timing signal is received at a device associated with the communication channel, obtaining a third time at which a channel signal is received at the device associated with the communication channel, obtaining a fourth time at which the channel signal is received at the device associated with the reference timing source, and calculating the offset using the first time, the second time, the third time, and the fourth time.