The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Mar. 17, 2006
Applicants:
Kiyotaka Ichiyama, Tokyo, JP;
Masahiro Ishida, Tokyo, JP;
Takahiro Yamaguchi, Tokyo, JP;
Mani Soma, Seattle, WA (US);
Inventors:
Kiyotaka Ichiyama, Tokyo, JP;
Masahiro Ishida, Tokyo, JP;
Takahiro Yamaguchi, Tokyo, JP;
Mani Soma, Seattle, WA (US);
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
A jitter measuring apparatus measures timing jitter of a signal-under-test. The jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, and a jitter measuring sub-unit for extracting the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.