The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Sep. 06, 2010
Ming-ji Dai, Hsinchu, TW;
Sheng-liang LI, Taipei, TW;
Ra-min Tain, Taipei County, TW;
Chun-kai Liu, Taipei, TW;
Chung-yen Hsu, Taoyuan County, TW;
Ming-te Lin, Taipei County, TW;
Kuang-yu Tai, Hsinchu, TW;
Ming-Ji Dai, Hsinchu, TW;
Sheng-Liang Li, Taipei, TW;
Ra-Min Tain, Taipei County, TW;
Chun-Kai Liu, Taipei, TW;
Chung-Yen Hsu, Taoyuan County, TW;
Ming-Te Lin, Taipei County, TW;
Kuang-Yu Tai, Hsinchu, TW;
Industrial Technology Research Institure, Hsinchu, TW;
Abstract
An apparatus and a method for measuring a diode chip are provided. The diode chip is placed on a thermal conductive element. The apparatus measures an instant starting current and a first temperature, which is associated with the instant starting current, of the thermal conductive element. After the diode chip operates, the apparatus adjusts the temperature of the thermal conductive element to a second temperature, such that the current of the diode chip is adjusted to be equal to the instant starting current. The apparatus calculates a property of the diode chip according to a real power of the diode chip and a difference between the first temperature and the second temperature.