The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Jul. 14, 2009
Yoshihiro Hashimoto, Saitama, JP;
Yoshihiro Hashimoto, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a test apparatus that tests a device under test, including a power supply that generates supply power supplied to the device under test; a transmission path that transmits the supply power generated by the power supply to the device under test; a high-capacitance capacitor that is provided between the transmission path and a ground potential; a low-capacitance capacitor that has a lower capacitance than the high-capacitance capacitor and that is provided between the transmission path and the ground potential at a position closer to the device under test than the high-capacitance capacitor is to the device under test; an intermediate capacitor that is provided between the transmission path and the ground potential at a position between the high-capacitance capacitor and the low-capacitance capacitor; and a current measuring section that measures current flowing through the transmission path between the intermediate capacitor and the low-capacitance capacitor.