The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2011
Filed:
Feb. 02, 2009
Wataru Doi, Tokyo, JP;
Yohei Hirakoso, Tokyo, JP;
Wataru Doi, Tokyo, JP;
Yohei Hirakoso, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A frequency characteristic measuring apparatus measures a device under test in which the frequency of an input signal and the frequency of an output signal differ from each other, simplifying the configuration of a tracking generator and peripheral circuits associated with the tracking generator, and simultaneously measuring the characteristics of the input signal and the output signal of the device under test. A spectrum analyzer has mixers, local oscillators and IF sections as first and second measuring units for measuring frequency characteristics of two input signals by performing frequency sweep in correspondence with a first or second frequency range, a mixer and an oscillator as a tracking generator section which operates by being linked to the frequency sweep operation in the first measuring unit, and a section which generates a trigger signal designating measurement start timing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile