The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2011
Filed:
Jun. 18, 2009
Koichi Minato, Tokyo, JP;
Takeshi Itoi, Tokyo, JP;
Sosuke Akao, Tokyo, JP;
Hidesato Hagiwara, Tokyo, JP;
Masayuki Yamamoto, Tokyo, JP;
Yuki Saito, Tokyo, JP;
Koichi Minato, Tokyo, JP;
Takeshi Itoi, Tokyo, JP;
Sosuke Akao, Tokyo, JP;
Hidesato Hagiwara, Tokyo, JP;
Masayuki Yamamoto, Tokyo, JP;
Yuki Saito, Tokyo, JP;
Toppan Printing Co., Ltd., Tokyo, JP;
Tokyo Ink Mfg. Co., Ltd., Tokyo, JP;
Abstract
A method of evaluating a color filter including a substrate, and at least three color pixels disposed thereon, the method includes determining an oblique visibility of a liquid crystal display device equipped with the color filter on the basis of value ξobtained from the equation (1):ξ=∫Δ(λ)·(λ)  (1)wherein 'a' and 'b' are values respectively representing a wavelength range of a continuous wavelength light and satisfying conditions of 380≦a, b≦780 and a<b; Δ(λ) represents an optical retardation obtained by irradiating each of color pixels with a continuous wavelength light containing light components with wavelength λ falling within a range of 380 nm to 780 nm at an incident angle, and subjecting the transmitted light to measurement using a spectroscopic ellipsometer, and T(λ) represents a spectral transmittance of the color pixels measured at the wavelength λ falling within a range of 380 nm-780 nm.