The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2011
Filed:
Jan. 03, 2008
Applicants:
Fazela M. Vohra, Sunnyvale, CA (US);
Carl Z. Zhou, Plano, TX (US);
Inventors:
Fazela M. Vohra, Sunnyvale, CA (US);
Carl Z. Zhou, Plano, TX (US);
Assignee:
Other;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing VLSI circuits comprises a two-pass diagnostic method for testing a circuit wherein a first pass comprises a conventional test flow wherein an ATPG tool generates a set of test patterns and identifies possible faulty nets within the circuit. A second pass focuses on a designated critical subset of the circuit extracted using a method for extracting a subset for failure diagnosis of the tested circuit. A second pass utilizes an extraction algorithm which extracts one or more critical subsets of the circuit in order to obtain more accurate failure diagnosis.