The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2011
Filed:
Nov. 06, 2007
Motohiro Yamazaki, Mito, JP;
Ryoji Inaba, Hitachinaka, JP;
Satoshi Takahashi, Hitachinaka, JP;
Tomohiro Shoji, Hitachinaka, JP;
Takeshi Ohura, Hitachinaka, JP;
Takashi Gomi, Hitachinaka, JP;
Motohiro Yamazaki, Mito, JP;
Ryoji Inaba, Hitachinaka, JP;
Satoshi Takahashi, Hitachinaka, JP;
Tomohiro Shoji, Hitachinaka, JP;
Takeshi Ohura, Hitachinaka, JP;
Takashi Gomi, Hitachinaka, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
The object of the present invention is that a dynamic range is extended in an electrophoresis unit and concentration differences among a plurality of samples measured simultaneously are increased. An irradiation time to the samples is adjusted during analysis without changing a sampling time. By shortening the irradiation time, a fluorescence amount of the samples is reduced to cause signal intensity detected by a detector to physically decrease. If the irradiation time is very short (several 100 msec), the irradiation time and fluorescence intensity are in a direct proportional relationship. It is known that, if the irradiation time is reduced to 1/n, the fluorescence intensity, that is, signal intensity to be detected will be 1/n. Thus, for data whose irradiation time is reduced to 1/n during analysis, data obtained by multiplying a substantially measured value by n is used for data analysis as a true value to be originally acquired.