The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2011
Filed:
Aug. 27, 2008
Chingwen Chang, Taipei, TW;
Wei-chia Cheng, Hsinchu, TW;
Shih-chieh Lin, Hualien, TW;
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
Abstract
A system that provides large instruction sets for testing memory yet reduces area overhead is disclosed. The system for testing a memory of an integrated circuit comprises a set of registers providing element based programmability for a plurality of tests, wherein each test includes a plurality of test elements; a finite state machine for receiving a plurality of test instructions from the set of registers, wherein the finite state machine dispatches signals instructing a test pattern generator to generate a test pattern; a memory control module for applying the generated test pattern to the memory; and a comparator module for comparing a response received from the memory to a stored, known response.