The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2011
Filed:
Nov. 13, 2008
Applicants:
Hiroto Kasai, Higashimatsuyama, JP;
Ken Harada, Fuchu, JP;
Inventors:
Hiroto Kasai, Higashimatsuyama, JP;
Ken Harada, Fuchu, JP;
Assignee:
HItachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
An electron beam observation device includes a mechanism which disposes a specimen at an upstream side in an electron beam traveling direction outside an objective lens, from which an image is transferred under a magnification of ⅕ to 1/30, in addition to an inside of the objective lens in which a specimen is disposed at a time of ordinary observation.
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Kasai, Hiroto. (2011). Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method (U.S. Patent No. 7939801). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7939801
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