The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2011

Filed:

May. 02, 2007
Applicants:

Keiko Nogawa, Hitachinaka, JP;

Michiaki Sekiguchi, Mito, JP;

Hiroshi Watanabe, Hitachinaka, JP;

Hiroaki Ishizawa, Hitachinaka, JP;

Terumi Tamura, Hitachinaka, JP;

Inventors:

Keiko Nogawa, Hitachinaka, JP;

Michiaki Sekiguchi, Mito, JP;

Hiroshi Watanabe, Hitachinaka, JP;

Hiroaki Ishizawa, Hitachinaka, JP;

Terumi Tamura, Hitachinaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 31/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automatic analyzing apparatus has an analysis section including an immunity analysis unit and a biochemical componential analysis unit. A sample rack which has undergone the immunity componential analysis is horizontally fed by a rack feeding mechanism from a position confronting the inlet of a rack stationing section to a position near the outlet of the rack stationing section, so that the sample rack is directly moved to a return line, while skipping over the rack stationing section, so as to be efficiently returned to the analysis section and subjected to a subsequent biochemical analysis. A sample rack that needs reexamination by an identical analysis unit is also returned in the same efficient way.


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