The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2011
Filed:
Jan. 23, 2008
Yukio Tsuda, Aiko-gun, JP;
Yukio Tsuda, Aiko-gun, JP;
Anritsu Corporation, Atsugi-Shi, JP;
Abstract
In a method of detecting a repetition frequency of a measured signal, in order to detect the waveform repetition frequency of the measured signal with high accuracy even in the presence of a frequency fluctuation in the measured signal, the repetition frequency of the measured signal acquired by the conventional method is used as a provisional repetition frequency, and the frequency change amount of the specified signal obtained in the case where the measured signal is sampled sequentially with a sampling frequency greatly changed from the provisional sampling frequency to generate a frequency fold at the time of sampling is detected. Based on the detected frequency change amount of the specified signal and the change amount of the sample number indicating how many times the frequency fold has occurred in the process, the error contained in the sampling number with a frequency fluctuation contained in the measured signal is calculated. Then, based on the error contained in this sample number, the provisional repetition frequency of the measured signal is corrected, thereby calculating the regular repetition frequency of the measured signal.