The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2011

Filed:

Jan. 15, 2008
Applicants:

Akira Onodera, Shiga, JP;

Yasunori Aoyama, Shiga, JP;

Inventors:

Akira Onodera, Shiga, JP;

Yasunori Aoyama, Shiga, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultrasonic transducer incorporated into an ultrasonic inspection apparatus for examining existence of defect in a sample dipped in water comprises a transducer main part having an oscillator which projects an ultrasonic wave to the sample, receives the reflected wave from the sample and outputs the received reflected wave as an echo signal, a transmitter substrate producing a drive pulse for emitting the ultrasonic wave to the oscillator, a receiver substrate for amplifying the echo signal, a housing for containing therein both substrates electrically connected, and connecting member for electrically connecting between a signal input/output terminal and the side of the oscillator in the transducer main part, wherein, when a maximum operational frequency of the ultrasonic wave emitted from the oscillator is referred to as fmax [MHz], the connecting member is set at a length of 100/fmax [cm] or less. Even if the sample to be examined is small, a desirable defect inspection can be achieved at an excellent examination accuracy.


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