The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

Dec. 23, 2008
Applicants:

Tsutomu Ishikawa, Yamanashi, JP;

Toyotoshi Machida, Yamanashi, JP;

Hirokazu Tanaka, Yamanashi, JP;

Inventors:

Tsutomu Ishikawa, Yamanashi, JP;

Toyotoshi Machida, Yamanashi, JP;

Hirokazu Tanaka, Yamanashi, JP;

Assignee:

Eudyna Devices Inc., Nakakoma-gun, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 3/10 (2006.01); H01S 3/13 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing method of a wavelength-tunable laser having a resonator including wavelength selection portions having wavelength property different from each other includes a first step of controlling the wavelength-tunable laser so as to oscillate at a given wavelength according to an initial setting value, a second step of tuning the wavelength property of the wavelength selection portions and detecting discontinuity point of gain-condition-changing of the wavelength-tunable laser, and a third step of obtaining a stable operating point of the wavelength selection portion according to a limiting point of an oscillation condition at the given wavelength, the limiting point being a point when the discontinuity point is detected.


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