The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2011
Filed:
Nov. 21, 2008
Edmundo DE LA Puente, Cupertino, CA (US);
David D. Eskeldson, Colorado Springs, CO (US);
Edmundo de la Puente, Cupertino, CA (US);
David D. Eskeldson, Colorado Springs, CO (US);
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Abstract
In one embodiment, apparatus for testing at least one device under test (DUT) includes a tester input/output (I/O) node, a DUT I/O node, a remote pin electronics block, a bypass circuit, and a control system. The remote pin electronics block provides a test function and is coupled between the tester I/O node and the DUT I/O node. The bypass circuit is coupled between the tester I/O node and the DUT I/O node and provides a signal bypass path between the tester I/O node and the DUT I/O node. The signal bypass path bypasses the test function provided by the remote pin electronics block. The control system is configured to enable and disable the bypass circuit. Methods for using this and other related apparatus to test one or more DUTs are also disclosed.